Force sensing and mapping by atomic force microscopy
نویسندگان
چکیده
Over the past 15 years, advances in the ¢eld of atomic force microscopy (AFM) have broadened its use from a high-resolution imaging instrument to a device capable of detecting and quantifying single molecular forces between surfaces in nearnative conditions. This article reviews developments in the force sensing ¢eld and focuses particularly on research that has seen the AFM utilised to produce two-dimensional maps of speci¢c molecular interaction sites on a sample surface. z2002 Elsevier Science B.V. All rights reserved.
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